Engineering Transactions, 66, 4, pp. 471–492, 2018

Tilt Measurements in Mechatronic Devices and Mobile Microrobots

Sergiusz ŁUCZAK
Institute of Micromechanics and Photonics, Faculty of Mechatronics, Warsaw University of Technology

A review of the author’s own research on tilt measurements in mechatronic devices by means of micromachined accelerometers is presented. This comprehensive study addresses such issues as adjusting metrological properties of a tilt sensor for the application in a specific kind of a mechatronic device, systematizing problems pertaining to tilt measurements, applying various methods of decreasing uncertainty of tilt measurements, performing related experimental studies using custom test rigs, and building novel prototypes of tilt sensors. Due to the implementation of the proposed measurement techniques, considerations and novel ideas, it is possible to determine tilt either in a much simpler way, which translates to lower cost, or much more precisely, depending on particular requirements to be satisfied.
Keywords: tilt; MEMS; accelerometer; mechatronics; accuracy
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Copyright © Polish Academy of Sciences & Institute of Fundamental Technological Research (IPPT PAN).


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DOI: 10.24423/EngTrans.856.20181113